Elk Grove Village, IL October 13, 2009 -- On September 21 in Rome, Italy, Sonoscan president Dr. Lawrence W. Kessler received the prestigious Rayleigh Award presented by the Ultrasonics, Ferroelectrics, and Frequency Control (UFFC) Society of the IEEE.
Each year a recipient is selected on the basis of achievements in research, education, publications, and technical innovations. Since he founded Sonoscan in 1974, Dr. Kessler has been a conspicuous leader in each of these areas. As the Chief Technology Officer of Sonoscan, he has been responsible for many of the numerous patents that Sonoscan has received over the years.
He has also spearheaded the continuous flow of technical innovations that have grown the utility and versatility of acoustic micro imaging systems into the industry that we have today. In 1975 Sonoscan introduced the first commercially available acoustic microscope, the SLAM (Scanning Laser Acoustic Microscope). In 1984 Sonoscan introduced the reflection-mode C-SAM® (C-Mode Scanning Acoustic Microscope) system, which was the precursor of all modern acoustic microscope systems.
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About Sonoscan: Sonoscan is the leading developer and manufacturer of acoustic microscopes and sophisticated acoustic micro imaging systems, widely used for nondestructive analysis of defects in industrial products and semiconductor devices. For over 30 years, Sonoscan’s attention to customer needs and investment in R&D has created systems that set industry standards for speed and accuracy. Key products include C-SAM® systems for off-line and laboratory analysis and FACTS2™ for automated production inspection.
Through SonoLab®, a division of Sonoscan, applications engineers with a total of more than two centuries of experience in acoustic microscopy, assist hundreds of customers annually to solve materials problems and quality control issues. SonoLab operates applications testing laboratories in six (6) global locations to serve the inspection needs of customers that do not have their own capability.