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AMI Overview
Imaging Modes
Advanced Features
Technology Applications
Quantitative B-Scan Analysis Mode (Q-BAM)™
Quantitative B-Scan Analysis Mode (Q-BAM)™ is a calibrated, non-destructive cross-section image in the X-Z plane of a sample, which is completely in focus through the entire Z depth and contains amplitude/polarity data. Q-BAM is considered to be a “Virtual Cross-section” of the sample.
Q-BAM Cross Section
Technical Updates

AMI Glossary

Application Notes


Mode Examples