Home > Technology > Imaging Modes > 3D TOF

The Profile, or Time-of-Flight (TOF), imaging mode utilizes the time information within the A-scan. By tracking the transit time from a reference, say the top surface of a part, to an internal feature or defect, a topographic image is created of the internal structure. This image shows a popcorn crack in a PEM where the brightness of the feature relates to depth. The brighter the feature the closer it is positioned to the package surface (reference).